TY  - CONF

T1  - Investigating the stability of thin film transistors with zinc oxide as the channel layer

JO  - 2007 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM PROCEEDINGS - 45TH ANNUAL

PY  - 2007/01/01

AU  - Cross RBM

AU  - De Souza MM

AU  - IEEE

ED  - 

DO  - DOI: 10.1109/RELPHY.2007.369935

SN  - 978-1-4244-0918-1

SP  - 467

EP  - +

Y2  - 2025/04/29

ER  -