@article{article, title  = {{The effect of gate-bias stress and temperature on the performance of ZnO thin-film transistors}},

 url = {{}},

 year = {{2008}},

 month = {{6}},

 author = {{Cross RBM and De Souza MM}},

 doi = {{10.1109/TDMR.2008.916307}},

 volume = {{8}},

 journal = {{IEEE Transactions on Device and Materials Reliability}},

 issue = {{2}},

 pages = {{277-282}},

 note = {{Accessed on 2025/04/29}}}